Gouy phase shift measurement using interferometric second-harmonic generation

Stéphane Bancelin, Jarno N. Van der Kolk, Andrew S. Quigley, Maxime Pinsard, Samuel P. Veres, Laurent Kreplak, Lora Ramunno, François Légaré
Opt. Lett.. 2018-04-17; 43(9): 1958
DOI: 10.1364/OL.43.001958


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1. Opt Lett. 2018 May 1;43(9):1958-1961. doi: 10.1364/OL.43.001958.

Gouy phase shift measurement using interferometric second-harmonic generation.

Bancelin S, Van der Kolk JN, Quigley AS, Pinsard M, Veres SP, Kreplak L, Ramunno
L, Légaré F.

We report on a simple way to directly measure the Gouy phase shift of a strongly
focused laser beam. This is accomplished by using a recent technique, namely,
interferometric second-harmonic generation. We expect that this method will be of
interest in a wide range of research fields, from high-harmonic and attosecond
pulse generation to femtochemistry and nonlinear microscopy.

PMID: 29714771

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